Second-Generation Channel Interface Processor (CIP2) Installation and Configuration 49
Running CIP2 Diagnostic Tests
In the preceding command display output, the character “e” means this special location has been
erased (which must be performed before any write operation). The character “b” means that the data
that is about to be written to this special location has been temporarily copied. The character “E”
signifies that the sector which was temporarily occupied by the data has been erased. The character
“S” signifies that the data was written to its permanent location in Flash memory.
The squeeze command operation keeps a log of which of these functions has been performed so
upon sudden power failure, it can come back to the right place and continue with the process. The
character “Z” means this log was erased after the successful squeeze command operation.
Recovering from Locked Blocks
A locked block of Flash memory occurs when power is lost or a Flash memory card is unplugged
during a write or erase operation. When a block of Flash memory is locked, it cannot be written to
or erased, and the operation will consistently fail at a particular block location. The only way to
recover from locked blocks is by reformatting the Flash memory card with the format command.
Caution Formatting a Flash memory card to recover from locked blocks will cause existing data to
be lost.
Running CIP2 Diagnostic Tests
There are six PCA and ECA diagnostic test routines, as follows:
• Processor test 1
• Processor test 2
• I/O device tests
• Serial link controller (SLC) device tests
• Internal electrical wrap
• External optical wrap (ECA only) or external electrical wrap (PCA only)
The external wrap routine will run in two modes: optical and electrical.
Note All diagnostic tests are run every time the adapter is started. They cannot be run
independently. The wrap tests require special wrap plugs for the PCA and ECA; contact a service
representative to obtain the appropriate wrap plugs.
